LATEST NEWS

Parameters that cannot be ignored in VMM acceptance

TIME:12-25 2020

When it comes to image measuring instrument, we are all familiar with it, because it is one of the measuring instruments in processing industry. When you need to measure a small and complex workpiece, image measuring instrument is a good choice, but do you know the key parameters to be recorded in the acceptance and inspection of equipment? Let's popularize it.

 

The calibration specification of optical image measuring instrument was issued on November 14th, 2011 and implemented on February 14th, 2012.

 

This specification is applicable to image measuring instruments in plane rectangular coordinate system. The guide of uncertainty evaluation in the calibration of geometric measurement equipment and the acceptance monitoring and re inspection monitoring of image measuring instrument are cited.

 

Some important parameters need to be known.

 

1. The measurement error of the image measuring instrument on the plane (exy): the measurement error represents the indication error of measuring the two-dimensional dimension by placing the product or sample in any direction on the image measuring plane.

 

2. The measurement error (EZ) of the image measuring instrument on the z-axis: the measurement error represents the indication error in the direction perpendicular to the image measuring plane and in the direction of single axis.

 

3. Dimension measurement error (EV) of the measuring head of the image measuring instrument: the indication error of any dimension of the measuring plane within the field of view of the image without moving the platform.

 

4. The consistency of the measurement results of each section measured by the image measuring instrument (EC): when the image measuring instrument measures on different sections of the optical axis, the consistency between the projection of the origin of each section coordinate and the XY plane can be understood as the vertical degree between the Z axis and the XY horizontal plane when the image measuring instrument moves up and down along the Z direction, and also can reflect the consistency of the measurement characteristics of the measuring head with the image at different heights.

 

5. Two dimensional detection error of image measuring instrument (P2D): measure the radius change amplitude of standard circle with image measuring instrument.

 

6. Probe detection error (PV) of image measuring instrument: measure the radius variation of standard circle within the field of view with image measuring instrument.

 

7. Zoom detection error (PZ) of image measuring instrument: measure the indication change amplitude of standard circle center coordinate with image measuring instrument at different magnification.

 

In recent years, optical image measuring instrument is widely used in the manufacturing field, which is closely related to people's life, and the industry is also showing a trend of rapid expansion. China's optical image measuring instrument industry market is also accelerating the merger and integration, with a large number of products and a significant increase. Some medium and low-grade products have been overcapacity, while the high-grade products have few varieties and many gaps, which are similar to China's There is an obvious gap in the performance of foreign products.


NAV

TOP